X-Ray Diffraction (XRD)

Service Line: 04 Imaging and Characterization

XRD

PANalytical’s X’Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:

• advanced materials science and nanotechnology
• metrologic characterization in semiconductor process development

It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:

• rocking curve analysis and reciprocal space mapping
• reflectometry and thin film phase analysis
• residual stress and texture analysis

Manufacturer: PANalytical
Model: X’Pert Pro/MRD

Contact:
Lou Deguzman
704-687-8111
pcdeguzm@charlotte.edu

Tool Location:

Grigg Hall, Third Floor Room: 386 Bay Number: N/A