Raith SEM

HONET 2021

IEEE 18th Int'l Conference HONET 2021

[ Smart Communities: Improving Quality of Life Using ICT, IoT & AI ]

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Service Line: 04 Imaging and Characterization

Raith Scanning Electronic Microscope

Integral to the Raith 150 E-beam Lithography system is the Zeiss/Leo FESEM column.  This ultra-high performance Scanning Electron Microscope column facilitates imaging and navigation of the sample, providing a maximum magnification of 1,000,000X, as well as multiple aperture and voltage settings.

Manufacturer: Raith
Model: Part of the 150 E-beam Lithography System

Lou Deguzman

Tool Location:

Grigg Hall, First Floor            Room: 153            Bay Number: N/A