X-Ray Diffraction (XRD)

Service Line: 04 Imaging and Characterization
XRD
XRD

PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for:

  • advanced materials science and nanotechnology
  • metrologic characterization in semiconductor process development

It can handle a wide range of applications, and is especially suitable for thin film analysis applications such as:

  • rocking curve analysis and reciprocal space mapping
  • reflectometry and thin film phase analysis
  • residual stress and texture analysis

Manufacturer: PANalytical
Model: X'Pert Pro/MRD

Contact:
Lou Deguzman
704-687-8111
pcdeguzm@uncc.edu

Tool Location:

Grigg Hall, Third Floor            Room: 386            Bay Number: N/A