Maximum Magnification: X300,000
Resolution: 3 nm
Capable of both high and low vacuum operation
Acceleration Voltages: 0.3 Kv to 30 Kv
Current work with the JEOL SEM and EDAX includes:
Imaging of etched micro-lenses as well as other micro and nano-structures.
Imaging and EDS analysis of man-made microspheres, nano–wires, etc.
Imaging and EDS analysis of fossil fuel power plant by-products.
Imaging of surface morphology and EDS analysis of semiconductor thin films.