The JEOL JSM 6460LV is a high-performance and versatile SEM.  A high-precision electron optical system is incorporated in this SEM which provides 3.0 nm resolution; maximum magnification is 300,000X.  Acceleration voltage can be varied from 0.3 to 30 kV to accommodate different sample requirements.  The JSM 6460LV has a large chamber that easily accommodates a 200 mm diameter specimen. The user friendly operating system is well suited for a multi-user environment.  The low vacuum option enables the non destructive image analysis of biological samples.  The SEM is also outfitted with an EDAX Energy Dispersive Spectroscopy (EDS) System  The EDAX system provides a means for identifying and quantifying elemental composition utilizing the x-rays that are emitted when electrons bombard the surface of a material.